Share Email Print
cover

Proceedings Paper

The study of fast identifying methods on ECNT
Author(s): Xiaoyun Sun; Donghui Liu; Nan Gao; Huiqin Sun; Jiann Sheng
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

BP network is applied on ECNT (Eddy Current Nondestructive Testing) to identify defect fast in this paper. Due to BP network having the disadvantages of large numbers of iteration and local minimum values, authors use RBF network on ECNT. The results show that numbers of iteration using RBF network are reduced faster than using BP network, and it is possible to detect online by RBF network.

Paper Details

Date Published: 2 September 2003
PDF: 5 pages
Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); doi: 10.1117/12.521900
Show Author Affiliations
Xiaoyun Sun, Hebei Univ. of Science and Technology (China)
Donghui Liu, Hebei Univ. of Science and Technology (China)
Xi'an Jiaotong Univ. (China)
Nan Gao, Hebei Institution of Technology and Vocation (China)
Huiqin Sun, Hebei Univ. of Science and Technology (China)
Jiann Sheng, Xi'an Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 5253:
Fifth International Symposium on Instrumentation and Control Technology
Guangjun Zhang; Huijie Zhao; Zhongyu Wang, Editor(s)

© SPIE. Terms of Use
Back to Top