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Proceedings Paper

Multisensor integrated automated inspection system
Author(s): Huacheng Chen; Boxiong Wang; Xiuzhi Luo; Zhenjiang Liu; Jie Ding; Jiqiang Zhu
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Paper Abstract

It is a trend of modern measurement technology to combine the contact and non-contact measurement techniques together to realize a more efficient and high-precision inspection of manufactured products. Based on an analysis of existing optical inspection technologies and the merits and shortcomings of coordinate measuring machine (CMM) technique, we propose a multi-sensor automatic inspection system, which combines the coordinate measuring machine with non-contact optical measuring apparatus and can select automatically either of the two methods for different (simple-geometry or complex free-form) measured objects so as to raise the accuracy amd efficiency of measurement. The general planning and key components of the system are discussed.

Paper Details

Date Published: 2 September 2003
PDF: 4 pages
Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); doi: 10.1117/12.521835
Show Author Affiliations
Huacheng Chen, Tsinghua Univ. (China)
Boxiong Wang, Tsinghua Univ. (China)
Xiuzhi Luo, Tsinghua Univ. (China)
Zhenjiang Liu, Tsinghua Univ. (China)
Jie Ding, Tsinghua Univ. (China)
Jiqiang Zhu, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 5253:
Fifth International Symposium on Instrumentation and Control Technology
Guangjun Zhang; Huijie Zhao; Zhongyu Wang, Editor(s)

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