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Proceedings Paper

Phonon modes structure spectrum research in DCF optical fiber Stokes Raman scattering gain spectrum
Author(s): Zaixuan Zhang; Jianfeng Wang; Chenxia Li; Tao Liu; Li Wang; Bizhi Dai; Insoo S. Kim; Honglin Liu; Yongxing Jin; Dawei Fang; Songlin Zhuang
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Paper Abstract

DCF optical fiber Stokes Raman forwrad scattering and backward scattering gain spectrum have been measured by Raman laser as a pump source and high spectral resolution four grating spectrometer. There are 15 phonon modes in the Stokes forward scattering region and 18 phonon modes in the Stokes backward scattering region. In the low frequency region, there are 3 characteristic phonon modes they are 41.4 cm-1, 68.0 cm-1 and 96.7 cm-1. The characteristic Raman peaks of DCF fiber is 434.7 cm-1 and 455.4 cm-1 that are correspond to 440 cm-1 and 490 cm of normal single mode fiber as a function of pump power has been measured. Measured DCF Raman gain spectrum is different from that in common reference and books. The reasons are the high Ge02 concentration in DCF fiber and the developing of measuring technology.

Paper Details

Date Published: 30 April 2004
PDF: 7 pages
Proc. SPIE 5279, Optical Fibers and Passive Components, (30 April 2004); doi: 10.1117/12.521656
Show Author Affiliations
Zaixuan Zhang, China Institute of Metrology (China)
Jianfeng Wang, China Institute of Metrology (China)
Chenxia Li, China Institute of Metrology (China)
Tao Liu, China Institute of Metrology (China)
Li Wang, China Institute of Metrology (China)
Bizhi Dai, China Institute of Metrology (China)
Insoo S. Kim, Korea Electrotechnology Research Institute (South Korea)
Honglin Liu, Univ. of Shanghai for Science and Technology (China)
Yongxing Jin, China Institute of Metrology (China)
Dawei Fang, China Institute of Metrology (China)
Songlin Zhuang, China Institute of Metrology (China)
Univ. of Shanghai for Science and Technology (China)

Published in SPIE Proceedings Vol. 5279:
Optical Fibers and Passive Components
Steven Shen; Shuisheng Jian; Katsunari Okamoto; Kenneth L. Walker, Editor(s)

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