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Proceedings Paper

Ellipse fitting of short light stripe for structured-light-based 2D vision inspection
Author(s): Guangjun Zhang; Zhenzhong Wei
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Paper Abstract

Structured light based 3D vision has wide applications in inspecting the form and position errors like straightness and coaxiality of cylindrical workpieces. But for these applications, the light stripe on the workpiece's surface is much too short, and contains inadequate data information, even with some noise. Under such circumstances, the ellipse fitting to the scattered data of the light stripe is not efficient enough, and its fitting accuracy is usually poor. To address this problem, a new least-square fitting method based on the constraint of ellipse minor axis (called CEMA method) is proposed in detail in this paper. Simulations are given for the proposed method and for five other popular methods described in the literature. The results show that the proposed method can efficiently improve the accuracy and the robustness of ellipse fitting to the scattered data of short light stripe.

Paper Details

Date Published: 2 September 2003
PDF: 6 pages
Proc. SPIE 5253, Fifth International Symposium on Instrumentation and Control Technology, (2 September 2003); doi: 10.1117/12.521365
Show Author Affiliations
Guangjun Zhang, Beijing Univ. of Aeronautics and Astronautics (China)
Zhenzhong Wei, Beijing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 5253:
Fifth International Symposium on Instrumentation and Control Technology
Guangjun Zhang; Huijie Zhao; Zhongyu Wang, Editor(s)

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