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Proceedings Paper

Variable angle spectroscopy polarimetry: a new optical characterization tool for semiconductors
Author(s): Bernard Drévillon
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Date Published:
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Proc. SPIE 5359, Quantum Sensing and Nanophotonic Devices, ; doi: 10.1117/12.521041
Show Author Affiliations
Bernard Drévillon, Ecole Polytechnique (France)


Published in SPIE Proceedings Vol. 5359:
Quantum Sensing and Nanophotonic Devices
Manijeh Razeghi; Gail J. Brown, Editor(s)

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