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Proceedings Paper

Statistical processing of elementary fringe patterns
Author(s): Victor Nascov; Adrian Dobroiu; Dan Apostol; Victor S. Damian
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Paper Abstract

Our paper concerns with statistical processing of digitally recorded straight equispaced fringe patterns. We determine the highest degree of accuracy that can be achieved in estimating fringe parameters by statistical processing in given statistical fluctuation conditions affecting the recorded image.

Paper Details

Date Published: 30 September 2003
PDF: 8 pages
Proc. SPIE 5227, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies, (30 September 2003); doi: 10.1117/12.519639
Show Author Affiliations
Victor Nascov, National Institute for Laser, Plasma, and Radiation Physics (Romania)
Adrian Dobroiu, National Institute for Laser, Plasma, and Radiation Physics (Romania)
Dan Apostol, National Institute for Laser, Plasma, and Radiation Physics (Romania)
Victor S. Damian, National Institute for Laser, Plasma, and Radiation Physics (Romania)


Published in SPIE Proceedings Vol. 5227:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies
Ovidiu Iancu; Adrian Manea; Dan Cojoc, Editor(s)

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