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Proceedings Paper

Detection of cracks and defects using electronic speckle pattern interferometry with a holographic optical element
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Paper Abstract

An electronic speckle pattern interferometry (ESPI) system for detection of cracks and defects is presented. In the first stage a holographic optical element (HOE) is recorded using a photopolymer material. Since the polymerization process occurs during recording, the holograms are produced without any development/processing. In the second stage the HOE is used in an ESPI configuration for detection of cracks and defects. Due to the introduction of the HOE in the ESPI set-up, precise alignment of the optical elements is not necessary. For this reason the system is well suited for industrial applications.

Paper Details

Date Published: 4 November 2003
PDF: 5 pages
Proc. SPIE 5226, 12th International School on Quantum Electronics: Laser Physics and Applications, (4 November 2003); doi: 10.1117/12.519489
Show Author Affiliations
Emilia Mitkova Mihaylova, Dublin Institute of Technology (Ireland)
Vincent Toal, Dublin Institute of Technology (Ireland)
Sridhar Reddy Guntaka, Dublin Institute of Technology (Ireland)
Suzanne Martin, Dublin Institute of Technology (Ireland)


Published in SPIE Proceedings Vol. 5226:
12th International School on Quantum Electronics: Laser Physics and Applications
Peter A. Atanasov; Alexander A. Serafetinides; Ivan N. Kolev, Editor(s)

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