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Proceedings Paper

Speckle-shear interferometry with increased sensitivity
Author(s): Ventseslav Christov Sainov; Nikola Mechkarov; Assen Shulev; Wim De Waele; Joris Degrieck; Pierre Michel Boone
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Paper Abstract

An improved sensitivity in speckle-shear interferometry for out-of-plane displacements measurement using 2D folding shear is obtained. A triple prism as a shearing device is utilized. The sensitivity of measurement is up to two times higher in comparison with the one-dimensional folding shear at the same loading of the object. The same approach was feasible to be applied for deformation investigation of microstructures with magnification. The proposed method is especially suitable for symmetrical field deformation measurement, residual stress detection, continuous monitoring of object subjected to risk and other tasks of non-destructive testing.

Paper Details

Date Published: 4 November 2003
PDF: 5 pages
Proc. SPIE 5226, 12th International School on Quantum Electronics: Laser Physics and Applications, (4 November 2003); doi: 10.1117/12.519488
Show Author Affiliations
Ventseslav Christov Sainov, Central Lab. of Optical Storage and Processing (Bulgaria)
Nikola Mechkarov, Central Lab. of Optical Storage and Processing (Bulgaria)
Assen Shulev, Institute of Mechanics (Bulgaria)
Wim De Waele, Ghent Univ. (Belgium)
Joris Degrieck, Ghent Univ. (Belgium)
Pierre Michel Boone, Ghent Univ. (Belgium)

Published in SPIE Proceedings Vol. 5226:
12th International School on Quantum Electronics: Laser Physics and Applications
Peter A. Atanasov; Alexander A. Serafetinides; Ivan N. Kolev, Editor(s)

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