Share Email Print
cover

Proceedings Paper

Study of mixed oxide perovskites (1-x)Sr(Al0.5Ta0.5)O3:xLaAlO3 single crystals using Raman and Brillouin scattering methods
Author(s): Tomasz Runka; K. Lapsa; R. Aleksiyko; Marek Berkowski; Marek Kozielski; Miroslaw Drozdowski
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Recently, much attention has been paid to new crystals, which can be used as substrates for HTSC thin films. Among others (1-x)Sr(Al0.5Ta0.5)O3:x LaAlO3 (SAT1-x:LAx) crystals are very promising for microwave device applications, due to their lattice matching to the HTSC materials, thermal compatibility, low dielectric constant and very low dielectric loss at microwave frequencies at low temperatures. In this paper we report preliminary results of Raman and Brillouin scattering study of mixed cubic perovskites SAT1-x:LAx single crystals. The Raman scattering spectra have been obtained for SAT1-x:LAx crystals with LA content in the range: 0.23<x<0.3. Our results have been discussed in terms of LA content. Using Brillouin scattering method the velocity of the acoustic phonons propagating in [100] and [110] directions has been estimated at room temperature. The Debye theory and obtained values of the phase velocities allowed us to calculate Debye temperature.

Paper Details

Date Published: 22 October 2003
PDF: 8 pages
Proc. SPIE 5136, Solid State Crystals 2002: Crystalline Materials for Optoelectronics, (22 October 2003); doi: 10.1117/12.518761
Show Author Affiliations
Tomasz Runka, Poznan Univ. of Technology (Poland)
K. Lapsa, Poznan Univ. of Technology (Poland)
R. Aleksiyko, Institute of Physics (Poland)
Marek Berkowski, Institute of Physics (Poland)
Marek Kozielski, Poznan Univ. of Technology (Poland)
Miroslaw Drozdowski, Poznan Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 5136:
Solid State Crystals 2002: Crystalline Materials for Optoelectronics
Jaroslaw Rutkowski; Antoni Rogalski, Editor(s)

© SPIE. Terms of Use
Back to Top