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Proceedings Paper

Account for topological phases in interferometric measurements
Author(s): V. A. Andreev; K. V. Indukaev
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Paper Abstract

The structure of the phase arising when a probing light beam passes an optical system is analyzed. Its value is determined by the length of the optical path of the beam, by the geometry of the trajectory and by the optical properties of the reflecting surface. This phase is a sum of the linear phase, the Fresnel phase and the Rytov-Vladimirski phase. An interferometer measures the sum of all these separate phases. We propose a method to extract these separate phases from the total one and, therefore, determine the corresponding characteristics of the object. In the case of an isotropic object the explicit formulas are found. The device based on this approach combines the properties of both a profilometer and an ellipsometer.

Paper Details

Date Published: 23 September 2003
PDF: 6 pages
Proc. SPIE 5067, Saratov Fall Meeting 2002: Laser Physics and Photonics, Spectroscopy, and Molecular Modeling III; Coherent Optics of Ordered and Random Media III, (23 September 2003); doi: 10.1117/12.518611
Show Author Affiliations
V. A. Andreev, AMPHORA Labs. Co. Ltd. (Russia)
K. V. Indukaev, AMPHORA Labs. Co. Ltd. (Russia)


Published in SPIE Proceedings Vol. 5067:
Saratov Fall Meeting 2002: Laser Physics and Photonics, Spectroscopy, and Molecular Modeling III; Coherent Optics of Ordered and Random Media III

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