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Proceedings Paper

End-point energy measurement in pulsed x-ray detectors
Author(s): Stephen E. Mitchell; Joshua D. Friedman; Edward J. McCrea; Herman E. Utiger
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Paper Abstract

High power pulsed x-ray sources (XRS) are common place for many radiographic and plasma physics applications. Developing such XRS’s for particular applications require accurate end-point voltage and dose measurements to adequately characterize and model these devices. A simple mathematical relationship, which yields end-point energy results as function of measured peak voltage and time response, has been extracted from the data sheets and specifications of a proprietary manufactured Silicon x-ray detector (XRD). The model takes into account the fractional energy absorbed, response time, linear absorption coefficients (including both photo-electric and Compton incoherent interactions), physical geometry, and transfer function of the biasing circuit.

Paper Details

Date Published: 20 January 2004
PDF: 8 pages
Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); doi: 10.1117/12.518576
Show Author Affiliations
Stephen E. Mitchell, Bechtel Nevada (United States)
Joshua D. Friedman, Bechtel Nevada (United States)
Edward J. McCrea, Bechtel Nevada (United States)
Herman E. Utiger, Bechtel Nevada (United States)

Published in SPIE Proceedings Vol. 5198:
Hard X-Ray and Gamma-Ray Detector Physics V
Larry A. Franks; Arnold Burger; Ralph B. James; Paul L. Hink, Editor(s)

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