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Proceedings Paper

Microsystem for measurement of impedance sensor parameters
Author(s): Jerzy Hoja; Grzegorz Lentka
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Paper Abstract

The paper presents a measurement microsystem of parameters of impedance sensors characterized by impedance modulus in the range of 100Ω÷1GΩ. A wide frequency range (100μHz÷1MHz), especially at very low frequencies, has been achieved by the use of the DSP (Digital Signal Processing) technique. The simple construction assures low cost of the microsystem. The form of a virtual instrument has been used; the measurement module is connected via RS-232 interface to a personal computer. This solution allows using the microsystem to impedance spectroscopy of newly-developed sensors but also leads to a realization of dedicated microsystem with own display. The measurement error of impedance modulus and phase has been determined in relation to measurement frequency and measured impedance.

Paper Details

Date Published: 22 September 2003
PDF: 8 pages
Proc. SPIE 5124, Optoelectronic and Electronic Sensors V, (22 September 2003); doi: 10.1117/12.517130
Show Author Affiliations
Jerzy Hoja, Gdansk Univ. of Technology (Poland)
Grzegorz Lentka, Gdansk Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 5124:
Optoelectronic and Electronic Sensors V
Wlodzimierz Kalita, Editor(s)

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