Share Email Print
cover

Proceedings Paper

Iridium L3-edge and oxygen K-edge x-ray absorption spectroscopy of nanocrystalline iridium oxide thin films
Author(s): A. Kuzmin; R. Kalendarev; J. Purans; D. Pailharey
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Structural investigations of the short range order around iridium and oxygen ions in nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique, were performed by x-ray absorption spectroscopy. The Ir L3-edge extended x-ray absorption fine structure and the O K-edge x-ray absorption near edge structure signals were measured at room temperature and analyzed within ab initio multiple-scattering and full-multiple-scattering approaches, respectively. The x-ray absorption spectroscopy results indicate the presence in the films of orderd regions - nanocrystals, having a size of about 10 angstrom and a structure rather close to that in crystalline iridium oxide IrO2. Such evidence agrees well with observations by x-ray diffraction, suggesting that the thin films are x-ray amorphous.

Paper Details

Date Published: 8 August 2003
PDF: 5 pages
Proc. SPIE 5123, Advanced Optical Devices, Technologies, and Medical Applications, (8 August 2003); doi: 10.1117/12.517024
Show Author Affiliations
A. Kuzmin, Univ. of Latvia (Latvia)
R. Kalendarev, Univ. of Latvia (Latvia)
J. Purans, Univ. of Latvia (Latvia)
D. Pailharey, Univ. de la Mediterranee (France)


Published in SPIE Proceedings Vol. 5123:
Advanced Optical Devices, Technologies, and Medical Applications
Janis Spigulis; Janis Teteris; Maris Ozolinsh; Andrejs Lusis, Editor(s)

© SPIE. Terms of Use
Back to Top