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Proceedings Paper

Low-frequency noise and quality prediction of MQW buried-heterostructure DFB lasers
Author(s): Sandra Pralgauskaite; J. Matukas; V. Palenskis; G. Letal; R. Mallard; S. Smetona
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Paper Abstract

A detailed study of both the optical and electrical low-frequency noise and correlation factor between optical and electrical fluctuation characteristics of single-mode multiple quantum wells (MQW) curied-heterostructure (BH) distributed feedback (DFB) laser diodes has been carried out under a wide current range. These techniques have been used to assess the structural differences between devices that exhibit superior and poor performance and reliability. It has been concluded that for the devices investigated here, the poor device performance characterstics (larger threshold current) and poor reliability are induced by the existence of defects in the interface between the active region and burying laser. These defects generate leakage currents that lead to teh larger threshold current. Defects migration during ageing forms clusters, and this leads to the poor reliability of the lasers. We demonstrate that the low-frequency noise investigations can detect the presence of defects that induce short device lifetime.

Paper Details

Date Published: 8 August 2003
PDF: 9 pages
Proc. SPIE 5123, Advanced Optical Devices, Technologies, and Medical Applications, (8 August 2003); doi: 10.1117/12.517008
Show Author Affiliations
Sandra Pralgauskaite, Semiconductor Physics Institute (Lithuania)
J. Matukas, Vinius Univ. (Lithuania)
V. Palenskis, Vinius Univ. (Lithuania)
G. Letal, Nortel Networks Optical Components (Canada)
R. Mallard, Nortel Networks Optical Components (Canada)
S. Smetona, Nortel Networks Optical Components (Canada)


Published in SPIE Proceedings Vol. 5123:
Advanced Optical Devices, Technologies, and Medical Applications
Janis Spigulis; Janis Teteris; Maris Ozolinsh; Andrejs Lusis, Editor(s)

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