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Proceedings Paper

The study of internal deformation fields in materials using digital speckle radiography
Author(s): Stephen G. Grantham; William G. Proud; John E. Field
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Paper Abstract

A method has been developed for visualizing the internal deformation fields in opaque materials during impact events using a combination of flash X-rays and digital speckle analysis. The random speckle pattern required for the digital speckle analysis is achieved by seeding the specimen with a layer of 20% coverage X-ray opaque powder, such as lead. By utilizing flash X-rays a comparison can be made of the images of the random pattern before and during an impact event using speckle pattern analysis software. This allows the displacement field to be determined.

Paper Details

Date Published: 1 August 2003
PDF: 6 pages
Proc. SPIE 4948, 25th International Congress on High-Speed Photography and Photonics, (1 August 2003); doi: 10.1117/12.516899
Show Author Affiliations
Stephen G. Grantham, Univ. of Cambridge (United Kingdom)
William G. Proud, Univ. of Cambridge (United Kingdom)
John E. Field, Univ. of Cambridge (United Kingdom)


Published in SPIE Proceedings Vol. 4948:
25th International Congress on High-Speed Photography and Photonics
Claude Cavailler; Graham P. Haddleton; Manfred Hugenschmidt, Editor(s)

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