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Proceedings Paper

Investigation of three interferometric techniques for detection of surface flaws in elastomers
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Paper Abstract

Non-destructive testing of rubber by optical means presents a challenge because rubber has different mechanical properties from conventional solids when subjected to stress. The size of flaws introduced in rubber during the manufacturing process is an important characteristic as they increase the stress in the specimen when it is in use. The use of electronic speckle pattern interferometry, electronic speckle pattern shearing interferometry and white light interferometry for non-destructive material characterization of rubber is presented. It is shown that electronic speckle pattern shearing interferometry can be of some use for visualization of flaws on the rubber surface under thermal stress. White light interferometry gives a complete profiling of the elastomer surface and it is only one of the three interferometric techniques for measuring flaws on the rubber surface.

Paper Details

Date Published: 27 May 2003
PDF: 6 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516669
Show Author Affiliations
Emilia Mitkova Mihaylova, Dublin Institute of Technology (Ireland)
Amir Tabakovic, Dublin Institute of Technology (Ireland)
Suzanne Martin, Dublin Institute of Technology (Ireland)
Vincent Toal, Dublin Institute of Technology (Ireland)


Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

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