Share Email Print
cover

Proceedings Paper

Measurement of deformation of paper subjected to tensile loads using electronic speckle pattern interferometry
Author(s): Eisaku Umezaki; Jyunnosuke Takakuwa; Katsunori Futase
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This study deals with the measurement of the deformation of sheets of recycled paper subjected to tensile loads using an electronic speckle pattern interferometry (ESPI) technique. Specimens with fibers, which constitute a sheet of paper, parallel and perpendicular to the direction of paper making are used to investigate the effect of the arrangement of fibers on the tensile property. The deformation of recycled paper is compared with that of virgin pulp paper. Results reveal that a large two-dimensional deformation of recycled paper can be measured using the ESPI technique, and that the directions of fibers, which constitute a sheet of paper, have a significant effect on the two-dimensional deformation of recycled paper.

Paper Details

Date Published: 27 May 2003
PDF: 6 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516668
Show Author Affiliations
Eisaku Umezaki, Nippon Institute of Technology (Japan)
Jyunnosuke Takakuwa, Nippon Institute of Technology (Japan)
Katsunori Futase, Taisei Lamic Co. Ltd. (Japan)


Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

© SPIE. Terms of Use
Back to Top