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Proceedings Paper

A valuable method for online wire quality control: light scattering from cylindrical rough surfaces
Author(s): Fernando Perez Quintian; Maria A. Rebollo; Ricardo Gabriel Berlasso; Nestor G. Gaggioli
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Paper Abstract

In several applications, it is necessary to measure the surface characteristics of a wire so, it is important to do it during the manufacturing process. This work presents two main results: First, an analytical expression for the angular distribution of the mean scattered intensity from cylindrical rough surfaces as a function of the characteristic statistical parameters of the heights. This expression allows to measure the ratio T/σ between the correlation length and the roughness. Second, a quantitative relationship between the size and shape of the speckle grains in the Fraunhofer zone and the statistical properties of the cylindrical rough surface. In the first case, it is shown that the scanning process inherent to usual detection systems can be replaced by single step detection using a screen and a CCD camera. Therefore, this method can be applied to on line wire surface testing where conventional procedures are inadequate. In the second one, the experimental autocorrelation functions at different angles gives another method for measuring the parameter T/σ. Then, the study of the light scattered from cylindrical rough surfaces seem to be of great interest because of its potential application in NDT of manufacturing and finishing processes of components like pipes, junctions, wires and bearings.

Paper Details

Date Published: 27 May 2003
PDF: 7 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516661
Show Author Affiliations
Fernando Perez Quintian, Univ. de Buenos Aires (Argentina)
Maria A. Rebollo, Univ. de Buenos Aires (Argentina)
Ricardo Gabriel Berlasso, Univ. de Buenos Aires (Argentina)
Nestor G. Gaggioli, Comision Nacional de Energia Atomica (Argentina)

Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

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