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Proceedings Paper

Application of artificial neural network in holographic and speckle interferometry
Author(s): Janos Kornis; Gabor Vasarhelyi
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Paper Abstract

Applications of artificial neural network in holographic interferometry and speckle metrology have been presented. Back-propagation neural network has been used for defect detection. Self-organizing networks has been successfully applied to determine interferometric fringe centerlines.

Paper Details

Date Published: 27 May 2003
PDF: 6 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516635
Show Author Affiliations
Janos Kornis, Budapest Univ. of Technology and Economics (Hungary)
Gabor Vasarhelyi, Budapest Univ. of Technology and Economics (Hungary)


Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003

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