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Proceedings Paper

Improvement of interferometric phase measurements by consideration of the speckle field topology
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Paper Abstract

Phase measurements require the measurement of interferogram intensities. In this paper it is investigated how the validity of the evaluated phase is affected by the averaging of the interferogram intensities across the pixels of a CCD-array. In our previous works it has been shown numerically that the validity of the phase values depends on the topology of the speckle field. Here, it is examined analytically how the topology influences the phase evaluation with respect to averaging. One result is that in certain cases the absolute value of the phase gradient can be determined solely from the intensity of the speckle field, without any reference beam. Based on this result the phase error at intensity maxima, saddle points and for stationary points of the phase is examined.

Paper Details

Date Published: 27 May 2003
PDF: 6 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516634
Show Author Affiliations
Ervin Kolenovic, Bremer Institut fur Angewandte Strahltechnik (Germany)
Wolfgang Osten, Institut fuer Technische Optik, Univ. Stuttgart (Germany)
Werner P.O. Juptner, Bremer Institut fur Angewandte Strahltechnik (Germany)


Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003

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