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Proceedings Paper

Phase singularities in dynamic speckle fields and their applications to optical metrology
Author(s): Wei Wang; Mitsuo Takeda; Nobuo Ishii; Yoko Miyamoto
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Paper Abstract

Instead of the intensity information used in conventional speckle metrology, we explore new possibilities of making use of the phase information of speckle patterns. We propose a new technique of displacement measurement that makes use of the phase singularities in the analytic signal of the speckle pattern, which is generated by Hilbert filtering. Experimental results are presented that demonstrate the validity and the limitation of the proposed technique.

Paper Details

Date Published: 27 May 2003
PDF: 6 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516629
Show Author Affiliations
Wei Wang, Univ. of Electro-Communications (Japan)
Mitsuo Takeda, Univ. of Electro-Communications (Japan)
Nobuo Ishii, Univ. of Electro-Communications (Japan)
Yoko Miyamoto, Univ. of Electro-Communications (Japan)


Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

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