Share Email Print
cover

Proceedings Paper

Shape measurement by endoscopic electronic-speckle-pattern interferometry with a two-wavelength method
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Endoscopic Electronic-Speckle-Pattern Interferometry (endoscopic ESPI) is a tool for the detection and the measurement of displacements and movements in technical and biological cavities. For an adequate measurement accuracy additional to the geometry of imaging and illumination, information about the shape and curvature of the investigated cavities is required. Investigations to measure the surface topometry by endoscopic ESPI combined with a two-wavelength method have been carried out. The advantage of this arrangement, which uses commercial endoscope imaging systems, is that it is possible to obtain object shape and displacement data with the same endoscopic interferometric measurement system. Therefore, in a first step, the phase difference distribution effected by the change of the illumination wavelength and the object shape is detected by spatial phase shifting and in a second evaluation step, the radial distortions of the endoscope imaging system are corrected and the geometry of endoscopic off-axis illumination is taken into account by an approximation.

Paper Details

Date Published: 27 May 2003
PDF: 6 pages
Proc. SPIE 4933, Speckle Metrology 2003, (27 May 2003); doi: 10.1117/12.516622
Show Author Affiliations
Bjorn Kemper, Univ. Munster (Germany)
Jochen Kandulla, Univ. Munster (Germany)
Sabine Knoche, Univ. Munster (Germany)
Gert von Bally, Univ. Munster (Germany)


Published in SPIE Proceedings Vol. 4933:
Speckle Metrology 2003
Kay Gastinger; Ole Johan Lokberg; Svein Winther, Editor(s)

© SPIE. Terms of Use
Back to Top