Share Email Print
cover

Proceedings Paper

Predicting beef tenderness using near-infrared spectroscopy
Author(s): Subbiah Jeyamkondan; Glenn A. Kranzler; Brad J. Morgan; Sarah Rust
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A near-infrared spectral reflectance system was developed and tested online to predict 14-day aged, cooked beef tenderness. A contact probe with a built-in tungsten-halogen light source supplied broadband light to the ribeye surface. Fiberoptics in the probe transmitted reflected light to a spectrometer with a spectral range of 400-2500 nm. In the first phase, steak samples (n=292) were brought from packing plants to the lab and scanned with the spectrometer. After scanning, samples were vacuum-packaged and aged for 14 days. They were then cooked in an impingement oven to an internal temperature of 70°C. Slice-shear force values were recorded for tenderness reference. In phase two, the spectrometer was modified for packing plant conditions. Spectral scans were obtained on-line on ribbed carcasses (n=276). A partial least square regression model was developed to predict tenderness scores from spectral reflectance. In phase three, the developed model was validated by scanning carcasses (n=200) on-line. The predicted shear-force values and samples were sent to the U.S. Meat Animal Research Center for third-party validation. At up to 70% certification levels, the system was able to successfully sort tough from tender carcasses.

Paper Details

Date Published: 30 March 2004
PDF: 10 pages
Proc. SPIE 5271, Monitoring Food Safety, Agriculture, and Plant Health, (30 March 2004); doi: 10.1117/12.516185
Show Author Affiliations
Subbiah Jeyamkondan, Oklahoma State Univ. (United States)
Glenn A. Kranzler, Oklahoma State Univ. (United States)
Brad J. Morgan, Oklahoma State Univ. (United States)
Sarah Rust, Oklahoma State Univ. (United States)


Published in SPIE Proceedings Vol. 5271:
Monitoring Food Safety, Agriculture, and Plant Health
George E. Meyer; Yud-Ren Chen; Shu-I Tu; Bent S. Bennedsen; Andre G. Senecal, Editor(s)

© SPIE. Terms of Use
Back to Top