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Proceedings Paper

An FTIR point sensor for identifying chemical WMD and hazardous materials
Author(s): Mark L. Norman; Aaron M. Gagnon; John A. Reffner; David W. Schiering; Jeffrey D. Allen
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Paper Abstract

A new point sensor for identifying chemical weapons of mass destruction and other hazardous materials based on Fourier transform infrared (FT-IR) spectroscopy is presented. The sensor is a portable, fully functional FT-IR system that features a miniaturized Michelson interferometer, an integrated diamond attenuated total reflection (ATR) sample interface, and an embedded on-board computer. Samples are identified by an automated search algorithm that compares their infrared spectra to digitized databases that include reference spectra of nerve and blister agents, toxic industrial chemicals, and other hazardous materials. The hardware and software are designed for use by technicians with no background in infrared spectroscopy. The unit, which is fully self-contained, can be hand-carried and used in a hot zone by personnel in Level A protective gear, and subsequently decontaminated by spraying or immersion. Wireless control by a remote computer is also possible. Details of the system design and performance, including results of field validation tests, are discussed.

Paper Details

Date Published: 8 March 2004
PDF: 7 pages
Proc. SPIE 5269, Chemical and Biological Point Sensors for Homeland Defense, (8 March 2004); doi: 10.1117/12.515881
Show Author Affiliations
Mark L. Norman, SensIR Technologies (United States)
Aaron M. Gagnon, SensIR Technologies (United States)
John A. Reffner, SensIR Technologies (United States)
David W. Schiering, SensIR Technologies (United States)
Jeffrey D. Allen, Georgia Department of Defense (United States)


Published in SPIE Proceedings Vol. 5269:
Chemical and Biological Point Sensors for Homeland Defense
Arthur J. Sedlacek; Richard Colton; Tuan Vo-Dinh, Editor(s)

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