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Novel, fast, line, and corner detector for compact storage of 2D and 3D object images
Author(s): Chia-Lun John Hu; Siri Chanekasi; Anya Boonnithivorakul
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Proc. SPIE 5265, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology, ; doi: 10.1117/12.515224
Show Author Affiliations
Chia-Lun John Hu, Southern Illinois Univ./Carbondale (United States)
Siri Chanekasi, Southern Illinois Univ./Carbondale (United States)
Anya Boonnithivorakul, Southern Illinois Univ./Carbondale (United States)


Published in SPIE Proceedings Vol. 5265:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
Bruce G. Batchelor; Heinz Hugli, Editor(s)

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