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Proceedings Paper

Contrast-enhanced refraction imaging
Author(s): Christopher J. Hall; Keith D. Rogers; Rob A. Lewis; Ralf Hendrik Menk; Fulvia Arfelli; Karen Kit-Wan Siu; A. Benci; M. Kitchen; Alessandra Pillon; Luigi Rigon; Andrew J. Round; Alan P. Hufton; Andrew Evans; Sarah E. Pinder; S. Evans
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Paper Abstract

An attempt has been made, for the first time, to extend the capabilities of diffraction enhanced imaging (DEI) using low concentrations of a contrast agent. A phantom has been constructed to accommodate a systematic series of diluted bromine deoxyuridase (BrDU) samples in liquid form. This was imaged using a conventional DEI arrangement and at a range of energies traversing the Br K-edge. The images were analyzed to provide a quantitative measure of contrast as a function of X-ray energy and (BrDU) concentration. The results indicate that the particular experimental arrangement was not optimized to exploit the potential of this contrast enhancement and several suggestions are discussed to improve this further.

Paper Details

Date Published: 30 December 2003
PDF: 5 pages
Proc. SPIE 5199, Penetrating Radiation Systems and Applications V, (30 December 2003); doi: 10.1117/12.515135
Show Author Affiliations
Christopher J. Hall, CCLRC Daresbury Lab. (United Kingdom)
Keith D. Rogers, Cranfield Univ. (United Kingdom)
Rob A. Lewis, Monash Univ. (Australia)
Ralf Hendrik Menk, Sincrotrone Trieste S.C.p.A. (Italy)
Fulvia Arfelli, Univ. degli Studi di Trieste (Italy)
Karen Kit-Wan Siu, Monash Univ. (Australia)
A. Benci, Monash Univ. (Australia)
M. Kitchen, Monash Univ. (Australia)
Alessandra Pillon, Sincrotone Trieste S.C.p.A. (Italy)
Luigi Rigon, Univ. degli Studi di Trieste (Italy)
Andrew J. Round, Cranfield Univ. (United Kingdom)
Alan P. Hufton, Christie Hospital NHS Trust (United Kingdom)
Andrew Evans, City Hospital Nottingham (United Kingdom)
Sarah E. Pinder, City Hospital Nottingham (United Kingdom)
S. Evans, Royal Marsden NHS Trust (United Kingdom)


Published in SPIE Proceedings Vol. 5199:
Penetrating Radiation Systems and Applications V
H. Bradford Barber; Hans Roehrig; F. Patrick Doty, Editor(s)

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