Share Email Print
cover

Proceedings Paper

Spectral element method: application to structural damage identification
Author(s): Usik Lee; Hyeong-Seon Yoo
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper introduces a spectral element model-based frequency-domain method of structural damage identification. The appealing features of the present damage identification method are: (1) it requires only the frequency response functions experimentally measured from damaged structure as the input data, and (2) it can locate and quantify many local damages at the same time. The feasibility of the present damage identification method is tested through some numerically simulated damage identification analyses and then experimental verification is conducted for a cantilevered beam with damage caused by introducing three slots.

Paper Details

Date Published: 14 October 2003
PDF: 8 pages
Proc. SPIE 5062, Smart Materials, Structures, and Systems, (14 October 2003); doi: 10.1117/12.514713
Show Author Affiliations
Usik Lee, Inha Univ. (South Korea)
Hyeong-Seon Yoo, Inha Univ. (South Korea)


Published in SPIE Proceedings Vol. 5062:
Smart Materials, Structures, and Systems
S. Mohan; B. Dattaguru; S. Gopalakrishnan, Editor(s)

© SPIE. Terms of Use
Back to Top