Share Email Print
cover

Proceedings Paper

NPL correction kit for enhanced and traceable reflectance measurement
Author(s): Peter J. Clarke
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A prototype kit containing artefacts, best practice guide and software for enhancing reflectance measurement data are described. The kit uses measurements made on calibrated artefacts to make other reflectance measurement data more reliable, in terms of zero offset and linearity, while also providing traceability to national reflectance scales. The use of the kit can give agreement between measurements made on the same artefact by different instruments of less than the colour discrimination limit of the human eye of 0.5 ΔE*ab colour difference units.

Paper Details

Date Published: 8 August 2003
PDF: 6 pages
Proc. SPIE 4826, Fourth Oxford Conference on Spectroscopy, (8 August 2003); doi: 10.1117/12.514533
Show Author Affiliations
Peter J. Clarke, National Physical Lab. (United Kingdom)


Published in SPIE Proceedings Vol. 4826:
Fourth Oxford Conference on Spectroscopy
Art Springsteen; Michael Pointer, Editor(s)

© SPIE. Terms of Use
Back to Top