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Proceedings Paper

Intercomparison of high-resolution color measurements with similar and dissimilar geometric conditions
Author(s): Danny C. Rich; Arthur W. Springsteen; Ronald O. Daubach; Michael R. Goodwin; Richard L. Austin
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Paper Abstract

CORM Technical Subcommittee OP-1 under Optical Properties of Materials, has undertaken a round-robin inter-comparison of several industrial laboratories. The basis of the inter-comparison is similar to that reported by Verrill and by Rich in that the Ceramic Colour Standards were shipped from one laboratory to the next. There were six participants in this inter-comparison, all possessing at least one instrument capable of reading the spectral diffuse reflectance factor from 360nm to 780nm at 5nm intervals with a 5nm bandpass, as recommended in Publication CIE 15.2. The laboratory temperature was recorded and kept to within 2° C of the nominal target. Some laboratories had second instruments with slightly different realizations of the CIE recommended geometry for diffuse reflectance factor. The results compare the readings from similar instruments (same manufacturer and geometry) and dissimilar instruments (same spectrometer but different geometry or different spectrometer and different geometry). This represents the first time that an inter-comparison of both similar and dissimilar spectrophotometers and reflectance accessories can be reviewed simultaneously.

Paper Details

Date Published: 8 August 2003
PDF: 7 pages
Proc. SPIE 4826, Fourth Oxford Conference on Spectroscopy, (8 August 2003); doi: 10.1117/12.514485
Show Author Affiliations
Danny C. Rich, Sun Chemical Corp. (United States)
Arthur W. Springsteen, Avian Technologies LLC (United States)
Ronald O. Daubach, Osram Sylvania Inc. (United States)
Michael R. Goodwin, Eastman Kodak Co. (United States)
Richard L. Austin, Gamma Scientific Inc. (United States)

Published in SPIE Proceedings Vol. 4826:
Fourth Oxford Conference on Spectroscopy
Art Springsteen; Michael Pointer, Editor(s)

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