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Proceedings Paper

Surface optical properties measured by the airborne research scanning polarimeter during the CLAMS experiment
Author(s): Thierry G Elias; Brian Cairns; Jacek Chowdhary
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Paper Abstract

Multi-angle multi-spectral scans of upward total and polarized radiance were measured by the Research Scanning Polarimeter onboard a Cessna 210 aircraft during the Chesapeake Lighthouse and Aircraft Measurements for Satellites experiment. The surface contribution to the polarized radiance (PR) was evaluated for its effect on the retrieval of aerosol properties from PR over land surfaces. The atmospheric contribution to PR was negligible at 2250 nm for an aerosol having an aerosol optical thickness (AOT) at 440 nm of 0.72 and AOT at 865 nm of 0.17. The atmospheric and surface contribution to PR at 865 nm were found to be similar for this aerosol load. Thus, although the 2250 nm measurements can be used to characterize the surface on this very turbid day, this is not the case for the 865 nm measurements. The polarized and total radiances at 1590 and 2250 nm were found to be strongly correlated, suggesting that a common physical process affects reflection and polarization since this correlation was present even within a given surface type. Near the backscattering direction a simple front facet Fresnel reflection model of surface polarization breaks down and the surface polarized reflectance shows considerable spectral variability and angular structure that may be of use in evaluating the structural parameters of vegetated and soil surfaces.

Paper Details

Date Published: 16 February 2004
PDF: 12 pages
Proc. SPIE 5235, Remote Sensing of Clouds and the Atmosphere VIII, (16 February 2004); doi: 10.1117/12.514245
Show Author Affiliations
Thierry G Elias, Univ. de Evora (Portugal)
Brian Cairns, NASA Goddard Institute for Space Studies (United States)
Jacek Chowdhary, NASA Goddard Institute for Space Studies (United States)

Published in SPIE Proceedings Vol. 5235:
Remote Sensing of Clouds and the Atmosphere VIII
Klaus P. Schaefer; Adolfo Comeron; Michel R. Carleer; Richard H. Picard, Editor(s)

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