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Proceedings Paper

Er3+-doped ultratransparent oxyfluoride glass-ceramics for application in the 1.54 micron telecommunication window
Author(s): Victor K. Tikhomirov; David Furniss; Angela B. Seddon; M. Beggiora; Ian M. Reaney
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Paper Abstract

We have fabricated ultra-transparent glass-ceramics in the system (SiO2)(Al2O3)(CdF2)(PbF2)(ZnF2):x(ErF3). Intensity, width and Stark-splitting of emission and absorption spectra of Er3+-dopants at 1.5 micron (4I13/24I15/2 transitions) change with the size of PbF2 nano-crystals hosting Er3+ dopants. We report the broadest and flattest emission spectrum of Er3+ and largest wavelength divergence of emission and absorption spectra for 4I13/24I15/2 transitions to date. Er3+ dopants are efficient nucleation centres in (SiO2)(Al2O3)(CdF2)(PbF2)(ZnF2):x(ErF3) oxy-fluoride glasses when heat-treated at 20 to 80°C above glass transition temperature Tg. The emission spectrum of Er3+ at 1.54 micron for the resulting glass-ceramics (GC) is the broadest (75 nm at the half-height-width in developed GC and up to 90 nm in quasi GC) and flattest (especially between 1530 to 1560 nm in quasi GC) to date to our knowledge. The broadness is of benefit for Erbium Doped Fibre Amplifier (EDFA) operating in the 1.54 micron fibre optic telecommunication window. The flatness is of benefit in the most often employed C-band of EDFA. We have achieved the largest reported wavelength divergence to date in the maximum of absorption (1505 nm) and emission (1544 nm) spectra of Er3+ in developed GC, which again is of benefit for reduction of noise in the EDFA caused by overlap of emission and absorption bands at about 1.54 μm (i.e. self-absorption).

Paper Details

Date Published: 29 April 2003
PDF: 11 pages
Proc. SPIE 5118, Nanotechnology, (29 April 2003); doi: 10.1117/12.513918
Show Author Affiliations
Victor K. Tikhomirov, Univ. of Nottingham (United Kingdom)
David Furniss, Univ. of Nottingham (United Kingdom)
Angela B. Seddon, Univ. of Nottingham (United Kingdom)
M. Beggiora, Univ. of Sheffield (United Kingdom)
Ian M. Reaney, Univ. of Sheffield (United Kingdom)


Published in SPIE Proceedings Vol. 5118:
Nanotechnology
Robert Vajtai; Xavier Aymerich; Laszlo B. Kish; Angel Rubio, Editor(s)

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