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Proceedings Paper

A large-format gated x-ray framing camera
Author(s): John A. Oertel; Tom Archuleta; Mike S. Bakeman; Phillip Sanchez; George Sandoval; Lou Schrank; Peter J. Walsh; Neal Pederson
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Paper Abstract

The design, construction and implementation of a large format gated x-ray camera (LFC) for the LANL inertial confinement fusion/ radiation physics program is described. The active area of the detector is 105 mm x 105 mm using three 35 mm x 105 mm microchannel plates (MCP), that are proximity focused to a monolithic P-43 phosphor screen. Gating of the six independent, 13 mm, tall electrical microstriplines, deposited on the MCP, is accomplished by six individually biased and delayed high-voltage electrical pulses. The electrical gating pulse is continuously adjustable from 200 ps to 1300 ps, yielding optical shutters of 80 ps to 1000 ps. All electrical functions are computer controlled and monitored. Images are created on the striplines by conventional x-ray pinhole image techniques and recorded by film or a 4096 x 4096 CCD camera that is fiberoptically coupled to the back of the phosphor screen. Construction is complete and the instrument is now operated on a routine basis at local and remote laser facilities. Detailed characterization of the camera is in progress.

Paper Details

Date Published: 28 January 2004
PDF: 9 pages
Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); doi: 10.1117/12.513761
Show Author Affiliations
John A. Oertel, Los Alamos National Lab. (United States)
Tom Archuleta, Los Alamos National Lab. (United States)
Mike S. Bakeman, Los Alamos National Lab. (United States)
Phillip Sanchez, Los Alamos National Lab. (United States)
George Sandoval, Los Alamos National Lab. (United States)
Lou Schrank, Los Alamos National Lab. (United States)
Peter J. Walsh, Los Alamos National Lab. (United States)
Neal Pederson, VI Control Systems (United States)

Published in SPIE Proceedings Vol. 5194:
Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
Zenghu Chang; Roman O. Tatchyn; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

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