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Proceedings Paper

Temporal analysis of optical complex structures: application to tomography through scattering media
Author(s): Karim Ben Houcine; Gerald Brun; David Reolon; Maxime Jacquot; Isabelle Verrier; Colette Veillas
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Paper Abstract

Optical Coherent Tomography (OCT) technique is based on an interferometric device bringing to the inter-correlation between a short reference pulse and the signal issued from the medium. This correlation is obtained by mechanical length modulation of the interferometer reference arm. We propose here an original technique using the SISAM (“Spectroscope Interferentiel a Selection par l’Amplitude de la Modulation”: Interferential Spectrometer by Selection of Amplitude Modulation) correlator, which allows to obtain directly without length modulation, the inter-correlation signal between the reference and the tests waves. With a large spectral bandwidth light source, the temporal depth of the original pulse is short compared to the signal diffused in the complex medium, and the inter-correlation function may be reduced to the impulse response of the structure to be studied. This temporal analysis could be very interesting to obtain both amplitude and phase parameters on the waves propagated in the medium, and could induce significant data on the medium and its structure. We will present the experimental SISAM device and results obtained in imaging through turbid media with this technique. We will also discuss about efficiency of this method in terms of accuracy and of ability to characterize complex structures and media.

Paper Details

Date Published: 18 February 2004
PDF: 8 pages
Proc. SPIE 5249, Optical Design and Engineering, (18 February 2004); doi: 10.1117/12.513618
Show Author Affiliations
Karim Ben Houcine, LTSI, CNRS-Univ. Jean Monnet St. Etienne (France)
Gerald Brun, LTSI, CNRS-Univ. Jean Monnet St. Etienne (France)
David Reolon, LTSI, CNRS-Univ. Jean Monnet St. Etienne (France)
Maxime Jacquot, LTSI, CNRS-Univ. Jean Monnet St. Etienne (France)
Isabelle Verrier, LTSI, CNRS-Univ. Jean Monnet St. Etienne (France)
Colette Veillas, LTSI, CNRS-Univ. Jean Monnet St. Etienne (France)


Published in SPIE Proceedings Vol. 5249:
Optical Design and Engineering
Laurent Mazuray; Philip J. Rogers; Rolf Wartmann, Editor(s)

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