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Proceedings Paper

Comparison of flux-tracing-based and diffraction-based strategies for optical system evaluation
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Paper Abstract

We report the comparison between two methods to evaluate optical systems. The flux-tracing method is an extension of the classical ray-tracing methods with additional energetic features. The direct integration method involves the calculation of the integral appearing in the diffraction theory of aberrations. We give a brief outline of the two methods and compare the results on a standard optical system. This will help to put in common the two methods to try to formulate new algorithms for the design of optical systems.

Paper Details

Date Published: 18 February 2004
PDF: 8 pages
Proc. SPIE 5249, Optical Design and Engineering, (18 February 2004); doi: 10.1117/12.513367
Show Author Affiliations
Josep Arasa, Univ. Politecnica de Catalunya (Spain)
Salvador Bosch, Univ. de Barcelona (Spain)
Josep Ferre-Borrull, Univ. de Barcelona (Spain)
Carles Pizarro, Univ. Politecnica de Catalunya (Spain)

Published in SPIE Proceedings Vol. 5249:
Optical Design and Engineering
Laurent Mazuray; Philip J. Rogers; Rolf Wartmann, Editor(s)

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