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Proceedings Paper

Simultaneous determination of thermo- and electro-optic coefficients by Fabry-Perot thermal scanning interferometry
Author(s): Jacques Mangin; Sandrine Fossier; Pierre Strimer; Gregory Gadret
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Paper Abstract

A proper implementation of electro-optic materials in laser systems requires an accurate knowledge of their electro-optic coefficients, along with their temperature dependence which could be of importance at high power level. A new technique has been developed for this purpose, which takes advantage of the thermodynamic equivalence of two intensive parameters, namely the temperature and applied electric field. A suitably oriented parallelepipedic shaped sample is exposed to a laser beam and acts as a Fabry-Perot interferometer which is submitted to a linear ramp of temperature. The interference pattern is observed by reflection and the shift of interference fringes generated by the thermo-optic effect is detected through amplitude modulation of the light beam and recorded as a function of temperature. We then switch from amplitude- to phase- modulation by applying a suitable electric field to the crystal: the signal features now the derivative of the thickness fringes generated by the electro-optic effect. The thermo- and electro-optic coefficients are obtained from the fringe shift recorded respectively through amplitude- and phase- modulated operating modes. The study of both KTiOPO4 and LiInS2 single crystals is given as an example to illustrate the so-called Fabry-Perot Thermal Scanning Interferometric (FPTSI) method.

Paper Details

Date Published: 26 February 2004
PDF: 8 pages
Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); doi: 10.1117/12.513284
Show Author Affiliations
Jacques Mangin, Univ. Bourgogne (France)
Sandrine Fossier, Univ. Bourgogne (France)
Pierre Strimer, Univ. Bourgogne (France)
Gregory Gadret, Univ. de Bourgogne (France)


Published in SPIE Proceedings Vol. 5252:
Optical Fabrication, Testing, and Metrology
Roland Geyl; David Rimmer; Lingli Wang, Editor(s)

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