Share Email Print
cover

Proceedings Paper

Modeling of a 3D CMOS sensor for time-of-flight measurements
Author(s): Rico Kuhla; Bedrich J. Hosticka; Peter Mengel; Ludwig Listl
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A solid state 3D-CMOS camera system for direct time-of-flight image acquisition consisting of a CMOS imaging sensor, a laser diode module for active laser pulse illumination and all optics for image forming is presented, including MDSI & CDS algorithms for time-of-flight evaluation from intensity imaging. The investigation is carried out using ideal and real signals. For real signals the narrow infrared laser pulse of the laser diode module and the shutter function of the sensors column circuit were sampled by a new sampling procedure. A discrete sampled shutter function was recorded by using the impulse response of a narrow pulse of FWHM=50ps and an additional delay block with step size of Δτ = 0.25ns. A deterministic system model based on LTI transfer functions was developed. The visual shutter windows give a good understanding of differences between ideal and real output functions of measurement system. Simulations of shutter and laser pulse brought out an extended linear delay domain from MDSI. A stochastic model for the transfer function and photon noise in time domain was developed. We used the model to investigate noise in variation the laser pulse shutter configuration.

Paper Details

Date Published: 19 February 2004
PDF: 10 pages
Proc. SPIE 5251, Detectors and Associated Signal Processing, (19 February 2004); doi: 10.1117/12.512946
Show Author Affiliations
Rico Kuhla, Siemens AG (Germany)
Bedrich J. Hosticka, Frauenhofer Institute of Microelectronic ... (Germany)
Peter Mengel, Siemens AG (Germany)
Ludwig Listl, Siemens AG (Germany)


Published in SPIE Proceedings Vol. 5251:
Detectors and Associated Signal Processing
Jean-Pierre Chatard; Peter N. J. Dennis, Editor(s)

© SPIE. Terms of Use
Back to Top