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Proceedings Paper

Automatic damage test benches: from samples to large-aperture optical components
Author(s): Marc Loiseau; Laurent Lamaignere; Roger Courchinoux; Gerard Raze; Caroline Sudre; Michel Josse; Thierry Donval; Herve Bercegol
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Paper Abstract

The functional lifetime of large aperture components used in high power lasers, like LIL and LMJ facilities, is mainly determined by laser damage measurements. Automatic damage test benches allow to obtain more data in less time than traditional tests. We present, first experimental procedures and statistical analysis made on small samples with mm-size beams, to determine damage densities and damage growth laws. The presented methods are the usual 1on1, Non1, Ron1 and Son1 tests and more specially the raster scan procedure. The tests and analysis are compared to other results obtained with larger beams (few cm2) on large optics. We show that the exact knowledge of each shot parameters (energy, surface and pulse duration) permits to determine the damage growth rate (and then to predict the lifetime of each optics), to precisely study self-focusing phenomenon and more to finely observe pre-damage-levels. In this way, the main parameters like fluence or intensity are associated to the observed phenomenon. Moreover laser beam diagnostics, many diagnostics used for the detection and the observation of damage occurrence are equally very important. It is also necessary to develop test procedures entirely computed which permit to scan all the surface of a component and to acquire in real time the beam parameters and the results of laser-matter interaction. Experimental results are reported to illustrate what could be achieved on an instrumented and automated facility.

Paper Details

Date Published: 26 February 2004
PDF: 11 pages
Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); doi: 10.1117/12.512939
Show Author Affiliations
Marc Loiseau, CEA-CESTA (France)
Laurent Lamaignere, CEA-CESTA (France)
Roger Courchinoux, CEA-CESTA (France)
Gerard Raze, CEA-CESTA (France)
Caroline Sudre, CEA-CESTA (France)
Michel Josse, CEA-CESTA (France)
Thierry Donval, CEA-CESTA (France)
Herve Bercegol, CEA-CESTA (France)

Published in SPIE Proceedings Vol. 5252:
Optical Fabrication, Testing, and Metrology
Roland Geyl; David Rimmer; Lingli Wang, Editor(s)

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