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Proceedings Paper

Z-scan studies of the nonlinear refractive index of fused silica in the nanosecond regime
Author(s): Thomas Olivier; Franck Billard; Hassan Akhouayri
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Paper Abstract

We present here a Z-scan based experimental setup and an adapted numerical simulation to perform absolute measurements of small nonlinear refractive indexes in the nanosecond regime, where bound electronic, as well as electrostriction and thermal effects, can occur. In order to have a reliable and stable experimental setup and a better sensitivity, a trimmed Airy beam has been used. An accurate study of the spatio-temporal parameters of the beam allows us to take into account the real nature of the beam in the nonlinear refractive index estimation. In these conditions, measurements have been performed in different types of fused silica at 1064nm and 532nm. A nonlinear refractive index of 5.2x10-20m2/W has been found at 1064nm and 3.5x10-20 m2/W at 532nm.

Paper Details

Date Published: 26 February 2004
PDF: 11 pages
Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); doi: 10.1117/12.512916
Show Author Affiliations
Thomas Olivier, Institut Fresnel (France)
Franck Billard, Institut Fresnel (France)
Hassan Akhouayri, Institut Fresnel (France)


Published in SPIE Proceedings Vol. 5252:
Optical Fabrication, Testing, and Metrology
Roland Geyl; David Rimmer; Lingli Wang, Editor(s)

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