Share Email Print
cover

Proceedings Paper

Repair of high-performance multilayer coatings
Author(s): David P. Gaines; Natale M. Ceglio; Stephen P. Vernon; Michael K. Krumrey; Peter Mueller
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Fabrication and environmental damage issues may require that the multilayer x-ray reflection coatings used in soft x-ray projection lithography be replaced or repaired. Two repair strategies were investigated. The first was to overcoat defective multilayers with a new multilayer. The feasibility of this approach was demonstrated by depositing high reflectivity (61% at 130 A) molybdenum silicon (Mo/Si) multilayers onto fused silica figured optics that had already been coated with a Mo/Si multilayer. Because some types of damage mechanisms and fabrication errors are not repairable by this method, a second method of repair was investigated. The multilayer was stripped from the optical substrate by etching a release layer which was deposited onto the substrate beneath the multilayer. The release layer consisted of a 1000 A aluminum film deposited by ion beam sputtering or by electron beam evaporation, with a 300 A SiO protective overcoat. The substrates were superpolished zerodur optical flats. The normal incidence x-ray reflectivity of multilayers deposited on these aluminized substrates was degraded, presumably due to roughness of the aluminum films. Multilayers, and the underlying release layers, have been removed without damaging the substrates.

Paper Details

Date Published: 1 January 1992
PDF: 11 pages
Proc. SPIE 1547, Multilayer Optics for Advanced X-Ray Applications, (1 January 1992); doi: 10.1117/12.51283
Show Author Affiliations
David P. Gaines, Brigham Young Univ. (United States)
Natale M. Ceglio, Lawrence Livermore National Lab. (United States)
Stephen P. Vernon, Vernon Applied Physics (United States)
Michael K. Krumrey, Physikalisch-Technische Bundesanstalt Berlin (Germany)
Peter Mueller, Physikalisch-Technische Bundesanstalt Berlin (Germany)


Published in SPIE Proceedings Vol. 1547:
Multilayer Optics for Advanced X-Ray Applications
Natale M. Ceglio, Editor(s)

© SPIE. Terms of Use
Back to Top