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Proceedings Paper

Methods for measuring single attosecond x-ray pulses
Author(s): Jiro Itatani; Fabien Quere; Gennady L. Yudin; Paul B. Corkum
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Paper Abstract

When an atom is ionized by an x-ray pulse in the presence of a laser field,the drift velocity of photoelectrons shows the phase dependence on the dressing field.We show how to use this effect to characterize single attosecond x-ray pulses.(i)Attosecond streak camera - the distortion of the photoelectron spectra induced by the laser field is used to map the temporal shape of the x-ray pulse to the photoelectron spectra.(ii) Attosecond SPIDER (spectral phase interferometry for direct electric-field reconstruction) - the spectral shearing interferometry of photoelectrons is used to directly retrieve the spectral phase of the x-ray pulse from the photoelectron spectra.

Paper Details

Date Published: 28 January 2004
PDF: 11 pages
Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); doi: 10.1117/12.512748
Show Author Affiliations
Jiro Itatani, National Research Council of Canada (Canada)
Fabien Quere, CEA Saclay (France)
Gennady L. Yudin, National Research Council of Canada (Canada)
Paul B. Corkum, National Research Council of Canada (Canada)


Published in SPIE Proceedings Vol. 5194:
Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
Zenghu Chang; Roman O. Tatchyn; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

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