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Proceedings Paper

Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter
Author(s): Marcel Flemming; Annette Hultaker; Karsten Reihs; Angela Duparre
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Paper Abstract

We have developed a novel approach to design ultra-hydrophobic surfaces with optical quality. The nanostructure necessary for the functional effect is realized through enhanced nanoroughness of optical thin films. At the same time, the optical appearance must not be disturbed by scattering from the roughness. We have found that through wide-scale roughness analysis, applying white light interferometry, AFM and STM, and subsequent data reduction the roughness characteristics can be directly related to the wetting properties. As, on the other hand, vector scattering theories connect the roughness properties with scatter losses, a formalism has been established, where both the wetting properties and scattering behavior can be expressed within the same "language". Using this tool, the optical thin film design and the surface nanoroughness can be tailored to fulfill demands on wetting properties as well as on sufficient low scatter levels. For the deposition of high index single layers on Borofloat 33 substrates, qualified substrate-film-combinations are predicted by "virtual" coating simulations. Experiments with single oxide layer as test coatings yielded surfaces with a high water contact angle and light scatter losses below defined scatter thresholds.

Paper Details

Date Published: 25 February 2004
PDF: 8 pages
Proc. SPIE 5250, Advances in Optical Thin Films, (25 February 2004); doi: 10.1117/12.512694
Show Author Affiliations
Marcel Flemming, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Annette Hultaker, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)
Karsten Reihs, SuNyx Surface Nanotechnologies GmbH (Germany)
Angela Duparre, Fraunhofer-Institut fuer Angewandte Optik und Feinmechanik (Germany)

Published in SPIE Proceedings Vol. 5250:
Advances in Optical Thin Films
Claude Amra; Norbert Kaiser; H. Angus Macleod, Editor(s)

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