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Proceedings Paper

Cosmic x-ray spectroscopy with multilayer optics
Author(s): Arthur B. C. Walker; Dennis S. Martinez-Galarce; Elizabeth S. Paris; Richard B. Hoover; Troy W. Barbee
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Paper Abstract

Multilayer optics operated at normal incidence offer a powerful new technology for the study of the solar spectrum in the XUV. The spectra of most cosmic X-ray sources are strongly extinguished at wavelengths above 40 A due to absorption and scattering by interstellar grains. We describe a number of configurations which allow multilayer optics to be used at nonnormal angles of incidence in conjunction with grazing incidence optics to analyze the spectra of cosmic X-ray sources in the wavelength interval between 1.5 and 40 A. These optical configurations utilize both multilayer mirrors and gratings, and permit the efficient observation of extended sources using stigmatic spectrographs. The response of the instruments described to typical cosmic X-ray sources is also discussed.

Paper Details

Date Published: 1 January 1992
PDF: 12 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51252
Show Author Affiliations
Arthur B. C. Walker, Stanford Univ. (United States)
Dennis S. Martinez-Galarce, Stanford Univ. (United States)
Elizabeth S. Paris, Stanford Univ. (United States)
Richard B. Hoover, NASA/Marshall Space Flight Ctr. (United States)
Troy W. Barbee, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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