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Proceedings Paper

Plasma imaging in the XUV wavelength range (175 A) using curved layered-synthetic-microstructure coated surfaces
Author(s): Sean P. Regan; L. K. Huang; Michael Finkenthal; Henry W. Moos; Troy W. Barbee
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Paper Details

Date Published: 1 January 1992
PDF: 5 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51250
Show Author Affiliations
Sean P. Regan, Johns Hopkins Univ. (United States)
L. K. Huang, Johns Hopkins Univ. (United States)
Michael Finkenthal, Hebrew Univ. (United States)
Henry W. Moos, Johns Hopkins Univ. (United States)
Troy W. Barbee, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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