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Proceedings Paper

Soft x-ray ion chamber
Author(s): Bo Chen; Ling Ma; Futian Li; Xingdan Chen
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Paper Abstract

The technique of soft x-ray ion chamber includes the measurement of the ion current as a function of rare gas pressure in the ion chamber. The true photoionization current, and hence absolute photon flux, is obtained by extrapolating ion current to zero gas pressure. This paper describes measurement of the absolute photon flux at He II 25.6 nm and CK(alpha) 4.47 nm.

Paper Details

Date Published: 1 January 1992
PDF: 5 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51245
Show Author Affiliations
Bo Chen, Changchun Institute of Optics and Fine Mechanics (China)
Ling Ma, Changchun Institute of Optics and Fine Mechanics (China)
Futian Li, Changchun Institute of Optics and Fine Mechanics (China)
Xingdan Chen, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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