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Proceedings Paper

Design and test of a high-resolution EUV spectroheliometer
Author(s): Thomas E. Berger; J. Gethyn Timothy; Arthur B. C. Walker; Helen Kirby; Jeffrey S. Morgan; Surendra K. Jain; Ajay Kumar Saxena; Jagadish C. Bhattacharyya; Martin H.C. Huber; Giuseppe Tondello; Giampiero Naletto
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Paper Details

Date Published: 1 January 1992
PDF: 15 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51241
Show Author Affiliations
Thomas E. Berger, Stanford Univ. (United States)
J. Gethyn Timothy, Stanford Univ. (United States)
Arthur B. C. Walker, Stanford Univ. (United States)
Helen Kirby, Stanford Univ. (United States)
Jeffrey S. Morgan, Stanford Univ. (United States)
Surendra K. Jain, Indian Institute of Astrophysics (India)
Ajay Kumar Saxena, Indian Institute of Astrophysics (India)
Jagadish C. Bhattacharyya, Indian Institute of Astrophysics (India)
Martin H.C. Huber, European Space Agency/ESTEC (Netherlands)
Giuseppe Tondello, Univ. di Padova (Italy)
Giampiero Naletto, Univ. di Padova (Italy)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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