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Proceedings Paper

Complete terrain deformation mapping with multiple-image differential interferometry
Author(s): Pablo Blanco; Oscar Mora; Jordi J. Mallorqui; Antoni Broquetas
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Paper Abstract

In this paper, an advanced technique for the generation of deformation maps using SAR (Synthetic Aperture Radar) data is presented. The algorithm estimates the linear and non-linear components of the displacement, the error of the Digital Elevation Model (DEM) used to cancel the topographic terms, and the atmospheric artifacts from a reduced set of low spatial resolution interferograms. The pixel candidates are selected from those presenting a good coherence level in the whole set of interferograms and the resulting non-uniform mesh tessellated with the Delaunay triangulation to establish connections among them. The linear component of movement and DEM error are estimated adjusting a linear model to the data only on the connections. Later on, this information, once unwrapped to retrieve the absolute values, is used to calculate the non-linear component of movement and atmospheric artifacts with alternate filtering techniques in both temporal and spatial domains. The method presents high flexibility with respect the required number of images and the baselines length. However, better results are obtained with large datasets of short baseline interferograms. The technique has been tested with ERS SAR data from an area of Catalonia (Spain) and validated with on-field precise leveling measurements.

Paper Details

Date Published: 13 February 2004
PDF: 12 pages
Proc. SPIE 5239, Remote Sensing for Environmental Monitoring, GIS Applications, and Geology III, (13 February 2004); doi: 10.1117/12.512396
Show Author Affiliations
Pablo Blanco, Univ. Politecnica de Catalunya (Spain)
Oscar Mora, Univ. Politecnica de Catatunya (Spain)
Institut Cartografic de Catalunya (Spain)
Jordi J. Mallorqui, Univ. Politecnica de Catalunya (Spain)
Antoni Broquetas, Univ. Politecnica de Catalunya (Spain)


Published in SPIE Proceedings Vol. 5239:
Remote Sensing for Environmental Monitoring, GIS Applications, and Geology III
Manfred Ehlers; Hermann J. Kaufmann; Ulrich Michel, Editor(s)

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