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Proceedings Paper

X-ray scattering measurements from thin-foil x-ray mirrors
Author(s): Finn Erland Christensen; B. P. Byrnak; Allan Hornstrup; Shou-Hua Zhu; Niels J. Westergaard; Herbert W. Schnopper; Lalit Jalota
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Paper Abstract

Thin foil X-ray mirrors are to be used as the reflecting elements in the telescopes of the X-ray satellites Spectrum-X-Gamma (SRG) and ASTRO-D. High resolution X-ray scattering measurements from the Au coated and dip-lacquered Al foils are presented. These were obtained from SRG mirrors positioned in a test quadrant of the telescope structure and from ASTRO-D foils held in a simple fixture. The X-ray data is compared with laser data and other surface structure data such as STM, atomic force microscopy (AFM), TEM, and electron micrography. The data obtained at Cu K-alpha(1), (8.05 keV) from all the mirrors produced on Al foils shows a scatter which limits the obtainable half-power width to above 1.5 arcmin. Mirrors based on electroformed Ni foils, however, show local regions with a factor of 4 better performance, and they are being developed for future applications.

Paper Details

Date Published: 1 January 1992
PDF: 10 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51225
Show Author Affiliations
Finn Erland Christensen, Danish Space Research Institute (Denmark)
B. P. Byrnak, Danish Space Research Institute (Denmark)
Allan Hornstrup, Danish Space Research Institute (Denmark)
Shou-Hua Zhu, Danish Space Research Institute (Denmark)
Niels J. Westergaard, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Danish Space Research Institute (Denmark)
Lalit Jalota, NASA/Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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