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Proceedings Paper

Grazing-incidence x-ray reflectivity: studies for the AXAF Observatory
Author(s): Patrick O. Slane; Daniel A. Schwartz; Leon P. Van Speybroeck; D. Jones; John H. Chappell; James W. Bilbro; Alan P. Shapiro; Sandeep D. Dave; P. Kidd; Scott C. Texter
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Paper Details

Date Published: 1 January 1992
PDF: 15 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51223
Show Author Affiliations
Patrick O. Slane, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Daniel A. Schwartz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Leon P. Van Speybroeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)
D. Jones, Harvard-Smithsonian Ctr. for Astrophysics (United States)
John H. Chappell, Harvard-Smithsonian Ctr. for Astrophysics (United States)
James W. Bilbro, NASA/Marshall Space Flight Ctr. (United States)
Alan P. Shapiro, NASA/Marshall Space Flight Ctr. (United States)
Sandeep D. Dave, Hughes Danbury Optical Systems, Inc. (United States)
P. Kidd, TRW, Inc. (United States)
Scott C. Texter, TRW, Inc. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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