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Proceedings Paper

Grazing-incidence x-ray reflectivity: studies for the AXAF Observatory
Author(s): Patrick O. Slane; Daniel A. Schwartz; Leon P. Van Speybroeck; D. Jones; John H. Chappell; James W. Bilbro; Alan P. Shapiro; Sandeep D. Dave; P. Kidd; Scott C. Texter
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Paper Abstract

The energy bandwidth and total throughput of a grazing incidence optics system is a strong function of the X-ray reflectivity of the surface coating. In support of the Advanced X-ray Astrophysics Facility (AXAF), studies are underway to evaluate and characterize the reflectivity of potential AXAF coatings. Here we report on results obtained for Au, Ir, and Ni coatings produced by electron-beam evaporation, evaporation with ion-assist, and sputtering. Effects of coating thickness and deposition angle have been evaluated at 6.4 and 8.1 keV; the highest reflectivities are those of the thinner, about 200 A vs about 700 A, coatings. While considerable variations exist, the best Ir samples have higher reflectivity than any of the Au coatings. Data results have been compared with models for theoretical reflectivity, particularly with regard to the effective density of the coatings. Independent measurements of the coating densities have been carried out for comparison with the reflectivity results.

Paper Details

Date Published: 1 January 1992
PDF: 15 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51223
Show Author Affiliations
Patrick O. Slane, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Daniel A. Schwartz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Leon P. Van Speybroeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)
D. Jones, Harvard-Smithsonian Ctr. for Astrophysics (United States)
John H. Chappell, Harvard-Smithsonian Ctr. for Astrophysics (United States)
James W. Bilbro, NASA/Marshall Space Flight Ctr. (United States)
Alan P. Shapiro, NASA/Marshall Space Flight Ctr. (United States)
Sandeep D. Dave, Hughes Danbury Optical Systems, Inc. (United States)
P. Kidd, TRW, Inc. (United States)
Scott C. Texter, TRW, Inc. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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