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Proceedings Paper

Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results
Author(s): Dale E. Graessle; Roger J. V. Brissenden; J. C. Cobuzzi; John P. Hughes; Edwin M. Kellogg; Fred E. Mootz; Daniel A. Schwartz; Patrick O. Slane; Martin V. Zombeck; Richard L. Blake; Jeffrey C. Davis
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Paper Details

Date Published: 1 January 1992
PDF: 13 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51222
Show Author Affiliations
Dale E. Graessle, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Roger J. V. Brissenden, Harvard-Smithsonian Ctr. for Astrophysics (United States)
J. C. Cobuzzi, Harvard-Smithsonian Ctr. for Astrophysics (United States)
John P. Hughes, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Edwin M. Kellogg, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Fred E. Mootz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Daniel A. Schwartz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Patrick O. Slane, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Martin V. Zombeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Richard L. Blake, Los Alamos National Lab. (United States)
Jeffrey C. Davis, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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