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Proceedings Paper

Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results
Author(s): Dale E. Graessle; Roger J. V. Brissenden; J. C. Cobuzzi; John P. Hughes; Edwin M. Kellogg; Fred E. Mootz; Daniel A. Schwartz; Patrick O. Slane; Martin V. Zombeck; Richard L. Blake; Jeffrey C. Davis
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Paper Abstract

The 1-percent calibration accuracy goal of the Advanced X-ray Astrophysics Facility is being approached by way of an experiment at the National Synchrotron Light Source that will demonstrate the accuracy achievable in reflectance measurements conducted on coated flat mirrors in the 50 eV-12 keV energy range. The coatings will be of commercially produced Au, Ni, and Ir, deposited either by sputtering or by e-beam deposition. Optical constants will be estimated via the reflectance vs. angle-of-incidence method.

Paper Details

Date Published: 1 January 1992
PDF: 13 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51222
Show Author Affiliations
Dale E. Graessle, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Roger J. V. Brissenden, Harvard-Smithsonian Ctr. for Astrophysics (United States)
J. C. Cobuzzi, Harvard-Smithsonian Ctr. for Astrophysics (United States)
John P. Hughes, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Edwin M. Kellogg, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Fred E. Mootz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Daniel A. Schwartz, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Patrick O. Slane, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Martin V. Zombeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Richard L. Blake, Los Alamos National Lab. (United States)
Jeffrey C. Davis, Los Alamos National Lab. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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