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Proceedings Paper

New method of manufacturing elastically bent crystals and multilayer mirrors
Author(s): George Gutman; James L. Wood
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Paper Abstract

We present a new high-precision and cost-efficient method of manufacturing aspheric crystals and pseudo-crystals. The concept including calculations, limits of precision, and manufacturing details is discussed. The advantages of this method are illustrated by the application and use of a Johansson bent quartz crystal in an x-ray sequential spectrometer. The resolving power of the spectrometer is compared with the Siemens SRS 300 and the Fisons/ARL 8420 by a comparative measurement of uranium ore. The comparison involves the detection of 0.006 Rb (K(alpha) ) present as background. Options for future investigations and applications of this method are discussed.

Paper Details

Date Published: 1 January 1992
PDF: 11 pages
Proc. SPIE 1546, Multilayer and Grazing Incidence X-Ray/EUV Optics, (1 January 1992); doi: 10.1117/12.51219
Show Author Affiliations
George Gutman, Ovonic Synthetic Materials Co. (United States)
James L. Wood, Ovonic Synthetic Materials Co. (United States)


Published in SPIE Proceedings Vol. 1546:
Multilayer and Grazing Incidence X-Ray/EUV Optics
Richard B. Hoover, Editor(s)

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